RU / EN

Issue №1, 2008 г.

GENERAL PHYSICS

Fliker noise and boson peak as a one and the same phenomenon
The authors: Veklenko B. A.
5
Structural properties of a macromolecule in the thermostat
The authors: Kharitonov A. S.
13
Temperature depen-dence of average length of a jump in the InGaN/GaN structures
The authors: Grushko N. S., Potanakhina L. N.
17
Filtering device on the basis of optical detail with positive and negative by derivative of relations of anglеs of full internal reflection to a wave-length
The authors: Filachev A. M., Saginov L. D., Kononov A. S., Sviridov A. N., Bakumenko V. L.
20
IR transmittance spectra of MCT epitaxial layers
The authors: Boltar K. O., Yakovleva N. I., Kashuba A. S., Udalova A. G
26
Influence of ionized radiation on anisotropy of electric properties of indium selenide
The authors: Askerov K. A., Gadzhieva V. I. T
31

PLASMA PHYSICS AND PLASMA TECHNOLOGIES

Vanadium oxide films for uncoo- led microbolometers produced by reactive magnetron sput-tering
The authors: Marchenko V. A.
35
Development of a decontamination method using the integral action of plasma beam discharge on microorganisms’ cells
The authors: Zinovyev O. A., Neumyvakin L. V.
39

NANOMATERIALS AND NANOTECHNOLOGIES

Emitting and magnetic properties of the pseudo-single domain micro and nanopatterned magnetic media
The authors: Gurovich B. A., Prikhodko K. E., Kuleshova E. A., Domantovsky A. G., Maslakov K. I.
44

PHOTOELECTRONICS: ELEMENTAL BASE AND TECHNOLOGY

Improved method for equalization temperature-induced non-uniformities in microbolometer FPA response
The authors: Dem'yanenko M. A., Ovsyuk V. N.
54
FPA nonuniformity correction method based on signals from observed scene
The authors: Solyakov V. N., Zhegalov S. I., Saginov L. D., Filachev A. M., Boltar K. O., Burlakov I. D., Sviridov A. N.
60
Methods creations contact metallization with In bump to silicon matrix MOS multiplexers
The authors: Akimov V. M., Vasileva L. A., Kagan N. B., Klimanov E. A., Kjurbet I. U., Liseykin V. P., Michertuneynz A. R., Sednev M. V., Seregina N. N., Shuckin S. V.
71
P-n-junctions on the basis of Hg1-xCdxTe received with an irradiation by low-energy ions of indium and argon
The authors: Ismayilov N. D., Guseyinov E. K., Gasanov I. S., Geyidarov S. A.
74
Some non-standard applications of thermoelectric coolers in photodetectors
The authors: Arakelov G. A.
77
Application of pulsed UV laser for dicing of arrays and linear of photodiodes based on MCT solid solution
The authors: Novoselov A. R., Klimenko A. G., Vasiliev V. V.
79
Transitional contacts of branches of TEM promoted durability on the basis of crystals of the hard solutions Bі-Te-Se-Sb
The authors: Asheulov A. A., Dobrovolsky Yu. G., Romanyuk I. S., Foty V. D.
85
Technological aspects of assembling the photoelectronic array modules on basis of lead chalcogenide with application of polymeric materials
The authors: Antipova M. A., Bochkov V. D., Davydov S. E., Kazarova Yu. A.
89
CMOS multiplexer with analogue TDI mode for hybrid FPA
The authors: Avetisyan G. H., Borodin D. V., Osipov Yu. V.
92
Histeresis of the capacitance-voltage characteristics of p-Cd0.27Hg0.73Te structures with wide graded gap layer on the surface
The authors: Vasilyev V. V., Mashukov Yu. P.
96

PHYSICAL EQUIPMENT

Comparison variants of scanning in thermal imager 2-nd generations
The authors: Aleev R. M., Nasibullin R. A
102
The research of the technology factors, which are influenced on the quality thin films dioxide of silicon with the purpose of increasing exploitation's characteristics of optical assemblies and which are made by a method of deep optical contact
The authors: Gerasjuk A. K., Goev A. I., Grinberg E. E., Potelov V. V., Senik B. N., Suhachev A. B., Nozdrachev A. V.
106
Algorithms of digital processing the IR images without calibration on geometrical noise
The authors: Bekhtin Yu. S., Barantsev A. A., Bryantsev A. A., Saginov L. D., Solyakov V. N., Medvedev A. S.
110